Search results for "Secondary electrons"
showing 10 items of 23 documents
A New Multipactor Effect Model for Dielectric-Loaded Rectangular Waveguides
2019
Multipactor is an electron discharge that may appear in particle accelerators and microwave devices such as filters, multiplexers, and RF satellite payloads in satellite on-board equipment under vacuum conditions. When some resonance conditions are satisfied, secondary electrons get synchronized with the RF fields, and the electron population inside the device grows exponentially leading to a multipactor discharge. This multipactor discharge has some negative effects that degrade the device performance: increase of signal noise and reflected power, heating of the device walls, outgassing, detuning of resonant cavities, and even the partial or total destruction of the component. The main aim…
Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models
2018
[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy.
2018
The quantification of surface acoustic waves (SAWs) in LiNbO3 piezoelectric crystals by stroboscopic X-ray photoemission electron microscopy (XPEEM), with a temporal smearing below 80 ps and a spatial resolution below 100 nm, is reported. The contrast mechanism is the varying piezoelectric surface potential associated with the SAW phase. Thus, kinetic energy spectra of photoemitted secondary electrons measure directly the SAW electrical amplitude and allow for the quantification of the associated strain. The stroboscopic imaging combined with a deliberate detuning allows resolving and quantifying the respective standing and propagating components of SAWs from a superposition of waves. Furth…
Quantitative microscopy of magnetic domains in Fe(100) by core-level x-ray photoelectron spectroscopy
2005
We present an experimental technique for imaging of magnetic domain patterns based on element-specific core-level photoemission using polarized soft-x-ray radiation. It is applied to the measurement of domain patterns at the Fe(100) surface and at the surface of polycrystalline Fe. Different from well established imaging techniques that use a photoemission electron microscope to measure the secondary electron intensity at the Fe absorption threshold, we have investigated the photoemission intensity contrast on the the Fe $2{p}_{3∕2}$ core level using circularly polarized x-ray light. The linear and circular dichroism characteristics of the identical domain pattern are extracted by linear co…
Elucidation of the Two-Step Damage Formation Process of Latent Tracks in Poly(allyl diglycol carbonate), PADC: Role of Secondary Low-Energy Electrons
2018
The aim of the present study is to evaluate the mechanisms by which secondary electrons of low energy degrade poly(allyl diglycol carbonate) (PADC) when it is used as a Solid State Nuclear Track De...
Electron beam induced optical and electronical properties of SiO 2
2000
Abstract Ionizing radiation in dielectric and optically transparent silica as well as thin SiO 2 layers produces defect luminescence as well as charge storage. A comparison of different excitation–relaxation processes like cathodoluminescence, charge injection and trapping, secondary electron field emission, and exoelectron emission leads to a generally similar excitation dose behaviour described by an electron beam saturation dose of 0.01–0.1 C/cm 2 . This suggests a correlation of these four electron excitation mechanisms likely related to the same kind of defect in glassy SiO 2 , the 2-fold-coordinated silicon Si: centre with typical electronic singlet–singlet and singlet–triplet transit…
Scanning electron microscopy analysis of defect clusters in multicrystalline solar grade silicon solar cells
2014
Solar cells from an identical commercial manufacturing unit have been investigated by electroluminescence to first detect the defect clusters. A further analysis has been done by scanning electron microscopy in secondary electron imaging mode to understand the propagation mechanism of defects. It appears that defect cluster boundaries can be very sharp or spread in the bulk with little apparent effect on the overall cell efficiency. And it is shown that grain boundaries act clearly as arrests to further propagation of these defects.
Laser photodetachment of radioactive $^{128}$I$^−$
2017
International audience; The first experimental investigation of the electron affinity (EA) of a radioactive isotope has been conducted at the CERN-ISOLDE radioactive ion beam facility. The EA of the radioactive iodine isotope (128)I (t (1/2) = 25 min) was determined to be 3.059 052(38) eV. The experiment was conducted using the newly developed Gothenburg ANion Detector for Affinity measurements by Laser PHotodetachment (GANDALPH) apparatus, connected to a CERN-ISOLDE experimental beamline. (128)I was produced in fission induced by 1.4 GeV protons striking a thorium/tantalum foil target and then extracted as singly charged negative ions at a beam energy of 20 keV. Laser photodetachment of th…
Development of the Jyväskylä microbeam facility
2012
Abstract A new microbeam facility is being constructed at the 1.7 MV Pelletron Accelerator in Jyvaskyla. The facility is designed for easy upgrading and incorporates a number of innovative features. Initially, it is based on a Heidelberg doublet with a design capability of a 3 × 5 μm beamspot at PIXE intensities and later upgraded to nanobeam performance. A thermal-expansion compensated rigid frame mounted on a mechanically isolated floor section is used to support the ion optical components. A compact-post focusing electrostatic deflector is used for high linearity beam scanning. This together with a novel time-stamped data collection (TDC) allows dynamic effects in IBIC, fluorescence blea…
Time-of-flight telescope for heavy-ion RBS
2007
Abstract This paper describes a time-of-flight (TOF) spectrometer for Heavy-Ion Rutherford Backscattering Spectrometry (HI-RBS) recently installed at IMEC for thin film analysis. The TOF telescope allows the use of ion beams heavier than He, with advantages in terms of depth and mass resolution and sensitivity compared to conventional RBS based on planar Si detectors. The start timing-signal is produced by the secondary electrons emitted from a thin C foil when traversed by a backscattered ion; the electrons are deflected in an electrostatic mirror towards a Micro-channel plate (MCP) assembly which provides a fast timing response. The stop signal is obtained directly from a second MCP assem…